kw.\*:("Microscopie force balayage")
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Force measurement with a piezoelectric cantilever in a scanning force microscopeTANSOCK, J; WILLIAMS, C. C.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1464-1469, issn 0304-3991Conference Paper
Adhesive energy, force and barrier height between simple metal surfacesCIRACI, S; TEKMAN, E; GÖKCEDAG, M et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 163-168, issn 0304-3991Conference Paper
Optical absorption spectroscopy by scanning force microscopyNONNENMACHER, M; WICKRAMASINGHE, H. K.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 351-354, issn 0304-3991Conference Paper
Surface investigations with a Kelvin probe force microscopeNONNENMACHER, M; O'BOYLE, M; WICKRAMASINGHE, H. K et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 268-273, issn 0304-3991Conference Paper
A detection technique for scanning force microscopyPROKSCH, R; DAN DAHLBERG, E.Review of scientific instruments. 1993, Vol 64, Num 4, pp 912-916, issn 0034-6748Article
Intermolecular and surface forces in noncontact scanning force microscopyHARTMANN, U.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 59-65, issn 0304-3991Conference Paper
Mechanical and thermal effects of laser irradiation on force microscope cantileversMARTI, O; RUF, A; HIPP, M et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 345-350, issn 0304-3991Conference Paper
Scanning force microscopy : Close to absolute zeroHUG, Hans Josef.GIT laboratory journal Europe. 2006, Vol 10, Num 2, pp 49-49, issn 1611-6038, 1 p.Article
Sharp, vertical-walled tips for SFM imaging of steep or soft samplesKELLER, D; DEPUTY, D; ALDUINO, A et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1481-1489, issn 0304-3991Conference Paper
Silicon cantilevers and tips for scanning force microscopyBRUGGER, J; BUSER, R. A; DE ROOIJ, N. F et al.Sensors and actuators. A, Physical. 1992, Vol 34, Num 3, pp 193-200, issn 0924-4247Conference Paper
Heterodyne force-detection for high frequency local dielectric spectroscopy by scanning Maxwell stress microscopyYOKOYAMA, H; JEFFERY, M. J; INOUE, T et al.Japanese journal of applied physics. 1993, Vol 32, Num 12B, pp L1845-L1848, issn 0021-4922, 2Article
Microlever with combined integrated sensor/actuator functions for scanning force microscopyBRUGGER, J; BLANC, N; RENAUD, P et al.Sensors and actuators. A, Physical. 1994, Vol 43, Num 1-3, pp 339-345, issn 0924-4247Conference Paper
In situ testing and calibration of tube piezoelectric scannersJULIAN CHEN, C.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1653-1658, issn 0304-3991Conference Paper
Blowing DNA bubblesSEVERIN, N; ZHUANG, W; ECKER, C et al.Nano letters (Print). 2006, Vol 6, Num 11, pp 2561-2566, issn 1530-6984, 6 p.Article
Local electrical dissipation imaged by scanning force microscopyDENK, W; POHL, D. W.Applied physics letters. 1991, Vol 59, Num 17, pp 2171-2173, issn 0003-6951Article
Circular DNA molecules imaged in air by scanning force microscopyBUSTAMANTE, C; VESENKA, J; CHUN LIN TANG et al.Biochemistry (Easton). 1992, Vol 31, Num 1, pp 22-26, issn 0006-2960Article
Novel design for a compact fiber-optic scanning force microscopeBINGGELI, M; KOTROTSIOS, G; CHRISTOPH, R et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2888-2891, issn 0034-6748Article
Interaction force detection in scanning probe microscopy : methods and applicationsDÜRIG, U; ZÜGER, O; STALDER, A et al.Journal of applied physics. 1992, Vol 72, Num 5, pp 1778-1798, issn 0021-8979Article
Phase and amplitude patterns in DySEM mappings of vibrating microstructuresSCHRÖTER, M.-A; STURM, H; HOLSCHNEIDER, M et al.Nanotechnology (Bristol. Print). 2013, Vol 24, Num 21, issn 0957-4484, 215701.1-215701.10Article
Rapid transitions between defect configurations in a block copolymer meltTSARKOVA, Larisa; KNOLL, Armin; MAGERLE, Robert et al.Nano letters (Print). 2006, Vol 6, Num 7, pp 1574-1577, issn 1530-6984, 4 p.Article
Carbon nanotubes as tips in non-contact SFMBARWICH, V; BAMMERLIN, M; BONARD, J.-M et al.Applied surface science. 2000, Vol 157, Num 4, pp 269-273, issn 0169-4332Conference Paper
Nanostructuring with laser radiation in the nearfield of a tip from a scanning force microscopeJERSCH, J; DEMMING, F; DICKMANN, K et al.Applied physics. A, Materials science & processing (Print). 1997, Vol 64, Num 1, pp 29-32, issn 0947-8396Article
Anisotropy of sliding friction on the triglycine sulfate (010) surfaceBLUHM, H; SCHWARZ, U. D; MEYER, K.-P et al.Applied physics. A, Materials science & processing (Print). 1995, Vol 61, Num 5, pp 525-533, issn 0947-8396Article
Characterization of a titanium nanoscopic wire by STM and SFMJOACHIM, C; ROUSSET, B; SCHÖNENBERGER, C et al.Nanotechnology (Bristol. Print). 1991, Vol 2, Num 2, pp 96-102, issn 0957-4484Article
Multifunctional probe microscope for facile operation in ultrahigh vacuumHOWALD, L; MEYER, E; LÜTHI, R et al.Applied physics letters. 1993, Vol 63, Num 1, pp 117-119, issn 0003-6951Article